Editorial Team

Editors-in-Chief

  1. Dr. Ken Clarkson, IBM, United States
  2. Dr. Günter Rote, Freie Universität Berlin

Editorial Board

  1. Dr. Hee-Kap Ahn, Postech, Korea, Republic of
  2. Dr. Oswin Aichholzer, Graz University of Technology, Austria
  3. Dr. Nancy M. Amato, Texas A&M University, United States
  4. Dr. Lars Arge, University of Aarhus, Denmark
  5. Prof. Boris Aronov, Polytechnic Institute of NYU, United States
  6. Dr. Mark de Berg, TU Eindhoven, Netherlands
  7. Prof. Jean-Daniel Boissonnat, INRIA Sophia-Antipolis, France
  8. Dr. Peter Brass, City College of New York, United States
  9. Dr. Sergio Cabello, University of Ljubljana, Slovenia
  10. Dr. Bernard Chazelle, Princeton University, United States
  11. Dr. Otfried Cheong, KAIST, Korea, Republic Of
  12. Dr. Ken Clarkson, IBM, United States
  13. Prof. Erik D. Demaine, MIT, United States
  14. Dr. Tamal K. Dey, The Ohio State University, United States
  15. Dr. Vida Dujmovic, Carleton University, Canada
  16. Jeff Erickson, University of Illinois, Urbana-Champaign, United States
  17. Dr. Hazel Everett, Université Nancy, France
  18. Dr. Xavier Goaoc, INRIA, France
  19. Anupam Gupta, Carnegie Mellon University, United States
  20. Dan Halperin, Tel Aviv University, Israel
  21. Dr. John Hershberger, Mentor Graphics, United States
  22. Ferran Hurtado, Universitat Politècnica de Catalunya, Spain
  23. Dr. Piotr Indyk, MIT, United States
  24. Dr. Marc van Kreveld, Utrecht University, Netherlands
  25. Dr. Stefan Langerman, Université Libre de Bruxelles
  26. Dr. Joseph S. B. Mitchell, Stony Brook University, United States
  27. Dr. Günter Rote, Freie Universität Berlin
  28. Dr. Christian Sohler, TU Dortmund, Germany
  29. Dr. Takeshi Tokuyama, Tohoku University, Japan
  30. Dr. Jan Vahrenhold, Technische Universität Dortmund, Germany
  31. Dr. Yusu Wang, The Ohio State University, United States
  32. Dr. David R. Wood, The University of Melbourne, Australia

Managing Editors

  1. Dr Joachim Gudmundsson, NICTA, Australia
  2. Pat Morin, Carleton University, Canada


ISSN: 1920-180X